Abstract: The annealing processes of low temperature grainoriented silicon steel which containing bismuth（Bi）and Bifree components have been studied by interrupting test，and the magnetic properties were measured by magnetic determinator (MPG200D), the evolution of texture and grain size was analyzed by Xray diffraction (XRD) and optical microscopy. The results showed that the primary grain size decreased and the secondary recrystallized grain size increased to 20~60 mm after the addition of Bi element. The onset temperature of secondary recrystallization was increased significantly after the addition of Bi element,and the temperature ranges of grain abnormal growth on containing Bi and Bifree sample were 1 080~1 100 ℃ and 1 060~1 080 ℃ respectively. The texture analysis showed that as the high temperature annealing temperature increased, the {111} and {100} textures were gradually weakened, the {110} texture and Goss texture were gradually enhanced. The texture transformation temperatures of containing Bi and Bifree samples were 1 100 ℃ and 1 080 ℃ respectively, then the Goss texture density and volume fraction increased gradually. The Goss texture density and volume fraction of Bicontaining samples were higher than those of Bifree samples.

Key words: low temperature grainoriented silicon steel, high temperature annealing, texture, bismuth（Bi）, grain size