Abstract: In the experiment, different thickness of low temperature oriented silicon steel hot rolled plate was cold rolled to 0.18 mm. The texture of the surface and central layer of the cold rolled plate was analyzed by XRD, and the section of the decarburized plate was analyzed by EBSD. In the cold rolled samples ,the results showed that the total content of {111} surface texture decreased, and {100} surface texture increased with the increase of reduction rate. In decarburized samples, the {111} texture increased significantly, especially the {111} 〈112〉 texture, and the {100} texture decreased significantly, especially the {100} 〈011〉 texture, and the {411} 〈148〉 texture increased significantly too.The grain size decreased with the increase of the reduction rate. The texture which was not conducive to the development of secondary recrystallization increased obviously, while the favorable CSL grain boundary decreased slightly with the increase of reduction rate.

Key words: thin oriented silicon steel, reduction rate, texture, cold rolling