Abstract: The microstructure and texture of 35W300 high-grade non-oriented silicon steel in hot-rolled plate, normalized plate, cold-rolled plate, and annealed plate states were characterized using optical microscopy and X-ray diffraction. The evolution of microstructure and texture in 35W300 was investigated. The results indicate that: The hot-rolled plate exhibits fine equiaxed grains in the surface layer, a transition layer containing both banded structure and fine equiaxed grains, and a central layer with banded structure. The surface layer contains Goss and Brass textures, while the quarter-thickness layer and central layer primarily show α-fiber and γ-fiber textures. The normalized plate displays equiaxed grains with an average grain size of （109.1±10） μm. The surface texture consists of Goss and Brass components, whereas the quarter-thickness and central layers are dominated by α*-fiber texture. The cold-rolled plate microstructure contains shear bands and deformation bands. Both surface and central layers exhibit similar textures dominated by α-fiber and γ-fiber components. The annealed plate demonstrates homogeneous equiaxed grains with an average grain size of （89.5±10） μm. Both surface and central layers show similar textures characterized by α*-fiber and γ-fiber components. This systematic characterization reveals the progressive evolution of microstructure and texture through different processing stages, providing insights into the structure--property relationships of high-grade non-oriented silicon steel.

Key words: high grade non-oriented silicon steel, microstructure, texture, evolution